Semiconductor parameter analyser – Wafer Probe Station
Semiconductor parameter analyser Agilent 4156C, Agilent 41501B ¿ Wafer Probe Station Karl Suss PSM 6
Description of the services offered
Parameter measurement, current-voltage curves and (static)-voltage capacity. 0 V ¿ ± 200 V, ± 1 pA ¿ ± 1 A. 4-position Wafer Probe Station.
Needs requested and applications
Sector or area of application
Electronics, optoelectronics, quantum communications
Differential skills
Previous references for provision of services
Equipment description
ISOM. HTSE Telecommunications
