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Structural analysis of samples of different sizes. Conductive and insulating samples are analysed. Metal coating for insulating samples can be requested as an add-on.
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The BTC-IMS currently has several microscopes, amongst which the following are noteworthy: Ion beam scanning electron microscope, Transmission electron microscope, Confocal microscope and Atomic force…
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ISOM Science and Technology Service within the framework of the field of PROCESSING TECHNIQUES
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