Site card
Atomic force microscope (AFM)
Where:
Center for Biomedical Technology
Ubicación:
Centro de Tecnología Biomédica (CTB)
Typology:
Infraestructura Científica
Manager: Rafael Daza
Email:
A conventional atomic force microscopy system with optical illumination by reflection. Currently, it is equipped with three different piezoelectrics, which allow areas of up to 140 x 140 mm2 to be scanned. It allows AFM images to be taken in contact, jumping, lithographic and dynamic (amplitude and frequency modulation) modes; spectroscopic measurements in 2 (FZ), 3 (3D) and 4 (general spectroscopy imaging, including force volume) dimensions; and long-distance measurements with retrace and plane scan methods.
Nanotribology, imaging, bioimaging, AFM, indentation, mechanical characterisation.
It allows images of all kinds of samples to be obtained, with sub-nanometric resolution, both in air and in controlled-environment conditions. From the mechanical perspective, it allows the mechanical properties of samples to be characterised at a sub-micrometric scale. Furthermore, it makes molecular manipulation possible and it makes it possible to characterise the changes in the different physical properties of the sample as the distance to it changes.
Image acquisition and determining the mechanical response of samples.
Affinity microscopy, single-molecule force spectroscopy (SMFS).
